Kyocera modules pass Fraunhofer PID test

  • Fraunhofer CSP tested modules for potential induced degradation. Image: Kyocera
    Fraunhofer CSP tested modules for potential induced degradation. Image: Kyocera

Kyocera’s PV modules have passed the Fraunhofer Center for Silicon Photovoltaics CSP’s PID test, the company has announced. The potential induced degradation (PID) test subjects the modules to high voltage stress to test the performance of individual modules, which can be negatively affected by PID, consequently affecting the power output of the entire system. Fraunhofer CSP has anonymously tested PV modules and Kyocera was among four types that passed the test, not showing degradation.

“As a pioneer in the industry Kyocera has been involved in R&D and manufacturing of solar power generating systems for more than 35 years, and in that time we have developed numerous innovations and manufacturing technologies to ensure the high quality and long-term durability of our products,” Tatsumi Maeda, general manager of the Kyocera Corporate Solar Energy Group, said. “With Kyocera's solar modules having been the first in the world to be certified by TUV Rheinland’s Long-Term Sequential Test, the Fraunhofer CSP test results further demonstrate the 2 industry-leading technology and reliable performance of Kyocera modules.”

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