Mitsubishi claims new solar cell performance record on thick and thin wafers

By reducing the contact resistance at the electrode, Mitsubishi Electric has increased the cell conversion efficiencies of its polycrystalline silicon wafers to 19.3%. Confirmed by the National Institute of Advanced Industrial Science and Technology (AIST) in Japan, the cell (15 cm x 15 cm x 200 micrometers) is 0.2 points higher than the company's previous record of 19.1%. The company also reported an ultrathin polycrystalline silicon PV cell (15 cm x 15 cm x 100 micrometers) reached efficiencies of 18.1%, a 0.7-point improvement over the company's previous record of 17.4%, also verified by AIST.

Mitsubishi’s approach to resistive loss uses a treatment to the wafer prior to electrode formation to improve electrical contact performance. The company said that this reduced resistive loss by 4% compared to previous PV cells.

The 0.2-point improvement over the previous record of 19.1% enables the electrical output in a cell of practical measurements to increase by approximately 1%, from 4.16W to 4.2W.

The new performance results were obtained with the integration of previously developed technology, such as a low-reflection, honeycomb-textured surfacing process that reduces sunlight loss caused by reflection and a reflective structure for the rear surfaces of the cell.

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