Your daily dose of photovoltaic technology developments and solar news

Product Briefing Outline: BrightView Systems has unveiled the InSight M Series, which it claims to be the world's first in-line process control and optimization tool developed specifically to address the challenges faced by thin-film solar cell manufacturers. The Wide Area Metrology (WAM) system provides continuous monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured panels.

Product Briefing Outline: J.A. Woollam has integrated its Flying M-2000 Spectroscopic Ellipsometer into a mapping tool for thin-film uniformity measurements over the entire PV panel.  The high accuracy and wide spectral coverage of the M-2000 ensure that every layer in a thin film stack can be measured, while new automation has been designed to ensure fast, precise measurements over the entire panel.