Your daily dose of photovoltaic technology developments and solar news

Product Briefing Outline: BrightView Systems has unveiled the InSight M Series, which it claims to be the world's first in-line process control and optimization tool developed specifically to address the challenges faced by thin-film solar cell manufacturers. The Wide Area Metrology (WAM) system provides continuous monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured panels.

Product Briefing Outline: J.A. Woollam has integrated its Flying M-2000 Spectroscopic Ellipsometer into a mapping tool for thin-film uniformity measurements over the entire PV panel.  The high accuracy and wide spectral coverage of the M-2000 ensure that every layer in a thin film stack can be measured, while new automation has been designed to ensure fast, precise measurements over the entire panel.

Product Briefing Outline: Solar Metrology, a provider of x-ray fluorescence (XRF) analysis tools, has expanded its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-ISI.

Product Briefing Outline: DuPont has introduced its new ‘Solamet’ PV412 photovoltaic (PV) metallization paste, the latest in a line of silver conductor materials specifically developed for thin film PV technologies.  DuPont collaborated with Ascent Solar Technologies, Inc. (ASTI), a developer of flexible thin-film solar modules, as it developed the new metallization paste.