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Product Briefings > Silicon TF

New Product: InSight M Series in-line metrology system optimizes thin-film processes

18 March 2010 | Thin Film, CdTe , CIGS, Silicon TF

BrightView Systems  InSight M Series in-line metrology toolProduct Briefing Outline: BrightView Systems has unveiled the InSight M Series, which it claims to be the world's first in-line process control and optimization tool developed specifically to address the challenges faced by thin-film solar cell manufacturers. The Wide Area Metrology (WAM) system provides continuous monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured panels.

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New Product: J.A. Woollam’s AccuMap-SE provides thin film measurement of panel uniformity

18 February 2010 | Thin Film, CdTe , CIGS, Silicon TF

J.A. Woollam's Flying M-2000 Spectroscopic EllipsometerProduct Briefing Outline: J.A. Woollam has integrated its Flying M-2000 Spectroscopic Ellipsometer into a mapping tool for thin-film uniformity measurements over the entire PV panel.  The high accuracy and wide spectral coverage of the M-2000 ensure that every layer in a thin film stack can be measured, while new automation has been designed to ensure fast, precise measurements over the entire panel.

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New Product: Kaneka launches ‘Hybrid’ micro-crystalline thin-film module in U.S.

21 January 2010 | Thin Film, Silicon TF , PV Modules

Product Briefing Outline: Kaneka has introduced a newly developed ‘Hybrid’ PV module to the US market. The Hybrid PV module uses tandem junction cells, employing a microcrystalline thin-film silicon layer and the thin-film amorphous silicon layer. The new module is said to achieve a maximum 42% higher energy conversion efficiency than Kaneka's conventional thin-film amorphous silicon PV module. The nominal power of the Hybrid PV module is 110Wp.

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New Product: Saflex claims 33% less material usage with new thinner PVB-based encapsulant

20 January 2010 | Thin Film, Silicon TF , PV Modules

Product Briefing Outline: Saflex, a unit of Solutia, has launched a new thin gauge polyvinyl butyral (PVB) based encapsulant designed specifically for photovoltaic applications. The new product, Saflex PA41, is claimed to significantly reduce encapsulant usage by 33%, while maintaining module durability and processing performance. The global launch of Saflex PA41 comes shortly after successful completion of IEC 61646 certification, with testing on thin-film modules. Saflex also partnered with module manufacturers to confirm that handling, processing, and throughput of Saflex PA41 met or exceeded expectations compared to thicker gauge PVB encapsulations.

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New Product: DuPont’s Solamet PV412 PV metallization paste handles flexible thin films

07 January 2010 | Thin Film, CIGS, Silicon TF

Product Briefing Outline: DuPont has introduced its new ‘Solamet’ PV412 photovoltaic (PV) metallization paste, the latest in a line of silver conductor materials specifically developed for thin film PV technologies.  DuPont collaborated with Ascent Solar Technologies, Inc. (ASTI), a developer of flexible thin-film solar modules, as it developed the new metallization paste.

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New Product: Schenk Vision’s I-V Curve Tracer enables correlation of optical inspection

16 December 2009 | Thin Film, Silicon TF

Product Briefing Outline: Schenk Vision has launched the I-V Curve Tracer from the SolarMeasure product family that enables correlation of optical inspection and efficiency tests (I-V curve) for thin-film PV production lines. Schenk has developed a new technology that is complimentary to flashers but enables an early feedback on the module efficiency.

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