Bruker’s ‘pcAFM’ performs OPV cell characterization in R&D environments

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  Bruker has launched its Photoconductive Atomic Force Microscopy (pcAFM) module for its ‘Dimension Icon’ platform that enables sample illumination while performing nanoscale electrical characterization.

Bruker has launched its Photoconductive Atomic Force Microscopy (pcAFM) module for its ‘Dimension Icon’ platform that enables sample illumination while performing nanoscale electrical characterization. In conjunction with Bruker’s ‘PeakForce TUNA’ technology, is claimed to provide the highest resolution photoconductivity and correlated nanomechanical mapping for research on fragile organic photovoltaic (OPV) device samples.

Problem

Nanoscale structure and properties are at the core of key OPV performance parameters, which require the highest resolution data for research into OPV technologies. Special care is also required to prevent damage to fragile samples.

Solution

The Dimension Icon pcAFM accessory is a modular addition to the Dimension Icon platform designed to retain the system’s top levels of performance while enabling photoconductivity measurements on OPVs and other photoelectric materials. It provides uniform backside sample illumination and can be fiber coupled to industry-standard solar simulators. In combination with Bruker’s PeakForce TUNA, it addresses the key challenge to avoid sample damage on fragile OPV samples, thus retaining highest spatial resolution photoconductivity data.

Applications

Photoconductivity measurements on OLEDs, OPVs and other photoelectric materials and samples.

Platform

The pcAFM module is said to be compatible with Bruker’s turnkey 1ppm glove box configuration, addressing the most stringent environmental control needs of organic photoelectric materials.

Availability

August 2012 onwards.