Product Reviews > CdTe

  • The all-black module's change in appearance results from the use of an advanced, all-black edge seal technology combined with an innovative

    First Solar’s ‘Series 3’ CdTe thin-film module platform offers harsh environment capability

    18 April 2013, 10:25

    First Solar has launched a new evolution of its Series 3 CdTe thin-film PV module platform. The ‘Series 3 Black’ is said to incorporate First Solar’s latest advances in conversion efficiency as well as additional features to enhance its performance in utility-scale power plants.

  • The EddyCus Thin-Film lab employs the eddy current method that utilizes local conductivity variations of the test objects for the characteri

    ‘EddyCus Thin-Film’ lab designed for contactless real-time thickness

    21 March 2013, 10:37

    SURAGUS GmbH, a spin-off from the Fraunhofer Institute for Non-Destructive Testing Dresden, offers the ‘EddyCus Thin-Film lab’ specifically for contactless real-time thickness and sheet resistance determination of low and high conductive thin-films on glass, wafer, plastics or foils.

  • The new paste has been claimed to have boosted CIGS thin-film manufacturer, Midsummer AB’s cell efficiencies by as much as 0.5%.

    Silver paste from DuPont offers lower processing temperatures for thin film solar cells

    24 April 2012, 09:33

    DuPont Microcircuit Materials (MCM) has introduced ‘DuPont Solamet PV416’ photovoltaic metallization paste used to raise the efficiency of thin film photovoltaic cells. The front-side silver paste material has the capability to be processed at temperatures below 140°C, and is designed to provide improved contact resistance, conductivity, adhesion and fine line resolution when printed on Transparent Conductive Oxides (TCOs). The new paste has been claimed to have boosted CIGS thin-film manufacturer, Midsummer AB’s cell efficiencies by as much as 0.5%.

  • The compact UNECS-2000 spectroscopic ellipsometer eliminates the need for conventional methods that mechanically or electrically control pol

    UNECS-2000 spectroscopic ellipsometer from Ulvac designed for fast R&D needs

    23 February 2012, 15:46

    ULVAC Technologies has introduced the UNECS-2000 spectroscopic ellipsometer for the high speed measurement of film thickness and optical constants of thin films in R&D applications.

  • Dr Schenk has developed a high-speed, non-destructive measurement of I-V curves of thin-film modules prior to the lamination step.

    Dr Schenk’s SolarMeasure I-V Curve Tracer offers individual cell electrical characterization

    23 November 2011, 12:09

    Dr Schenk has developed a high-speed, non-destructive measurement of I-V curves of thin-film modules prior to the lamination step. The SolarMeasure I-V Curve Tracer evaluates the characteristics of every individual cell on the complete thin-film panel and detects local variations. These measurements can be taken in-line and the results serve as a GO/NO-GO test of whether a panel should be processed further.

  • Dosing pumps are claimed to apply the material accurately to a tenth of a millimetre.

    Bystronic’s photovoltaic-TPA system offers continuous encapsulation and sealing of thin-film modules

    09 November 2011, 21:55

    The photovoltaic-TPA (Thermo Plastic Applicator) from Bystronic glass group is a machine designed for the encapsulation and sealing of thin-film photovoltaic modules. The machine is claimed to be the first machine of this type that is capable of working in 24-hour operation without any interruption.

  • The TEC products offer a range of conductivity, morphology and haze requirements to help maximize module efficiency.

    TCO thin-film coatings from NSG offer wide-application optimization

    05 October 2011, 14:42

    The NSG Group is a leader in TCO (transparent conductive oxide) coated glass for thin-film photovoltaic applications. Its ‘TEC’ product range is a group of products, including a comprehensive range of TCO coated glass, optimized to suit a variety of thin-film photovoltaic technologies.

  • The fully automated X-Ray Fluorescence System has been designed to qualify various deposition process steps in photovoltaic production lines

    Manz offers XRF-inline quality system for thin film metrology requirements

    28 September 2011, 19:56

    Manz AG has launched an XRF-inline quality system (IQ-XRF) as an extension of its Manz IQ Series. The fully automated x-ray fluorescence system has been designed to qualify various deposition process steps in photovoltaic production lines. Two of these XRF-systems were recently integrated into a photovoltaic line and show their ability to perform in 24/7 operations.

  • Equipped with in-house developed spectrometers, the system provides fast full surface thickness evaluation of multiple layers at nano-scale

    Dr. schwab IT’s FPI system enables fast full surface thickness evaluation of thin films

    10 August 2011, 14:20

    With the FPI solar series, dr. schwab IT has developed metrology systems covering all aspects of the production process for thin-film panel manufacturing. The new system meets volume production speed requirements with full surface measurement for quality assurance as well as continuous monitoring of all process parameters helping to increase productivity and yield of production lines.

  • Gerold’s HMA-system automatically applies liquid butyl (hot-melt) for edge-sealing of thin-film modules

    Gerold’s HMA-system offers automatic hot melt edge-sealing of thin-film modules

    03 August 2011, 14:30

    Gerold’s HMA-system automatically applies liquid butyl (hot-melt) for edge-sealing of thin-film modules, replacing the need for butyl tape, which has limiting use factors in high-volume production applications. Gerold claims the HMA-system offers more economical packing drums, less waste, and improved product quality.

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