Craic Technologies’ 20/20 PV microspectrometer measures thickness of thin-film optical

  • CRAIC Microspectrometer
    CRAIC Microspectrometer

Product Briefing Outline: Craic Technologies has launched the 20/20 PV Microspectrometer, which is designed to measure UV-visible NIR-range transmission, absorbance, reflectance, and emission and fluorescence spectra of sample areas smaller than a micron in width. The thickness of thin films and colour spaces can also be determined. The 20/20 PV system is claimed to be the most powerful instrument from Craic Technologies. 

Problem: Engineers need to test the quality of the cell from a number of different aspects, which can be challenging due to the lack of range of some microspectrometers on the market.

Solution: The 20/20 PV Microspectrometer can take spectra and images of microscopic samples from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence, and is available with both the DirecVu function to view samples by eye as well as with a high-resolution UV-visible NIR digital imaging system. While microspectra are being acquired, the sample may be viewed with high-resolution digital imaging in the deep UV, in colour or in the near infrared. Additional ease of use features include improvements to the instrument's ergonomics, software and automation.

Applications: The tool can measure UV-visible NIR-range transmission, absorbance, reflectance, and emission and fluorescence spectra of sample areas smaller than a micron in width with one seamless operation. Sampling areas can range from over 100 microns across to less than a micron.

Platform: Available with both the DirecVu to view samples by eye as well as a high-resolution UV-visible-NIR digital imaging system.

Availability: Currently available.

Post a Comment

Post

Newsletter

Preview Latest Subscribe
We won't share your details - promise!

Publications

  • Photovoltaics International 14th Edition

    Photovoltaics International 14th Edition

    Published in November 2011, the 14th edition of Photovoltaics International provides a variety of technical papers from some of the industry’s stalwarts. Features include: TÜV Rheinland on junction box testing; Laser Zentrum Hannover on laser edge isolation of mc-Si cells; Calisolar on the importance of traceability; Fraunhofer ISE on EWT cells; and EPIA on Europe’s LCOE.

  • Photovoltaics International Lite, Volume 05 - 2011

    Photovoltaics International Lite, Volume 05 - 2011

    This digital interactive Lite sees Tom Cheyney follow Agua Caliente’s progress on becoming one of first truly utility-scale PV power farms, where 40–50MW (AC) will be commissioned by the end of the year. We also feature one of the world’s largest silicon thin-film PV power plants, Avenal; a report on warnings of the collapse of module prices from Solarbuzz and PI-Berlin presents tips on PV module testing. A print version of this edition will be distributed at Solar Power International 2011 in Dallas, Texas.

  • Manufacturing The Solar Future: The 2011 Production Annual

    Manufacturing The Solar Future: The 2011 Production Annual

    Manufacturing the Solar Future is the primary source guide for detailed information on the PV production process. This annual provides technical details on how the leading companies and research organizations worldwide are addressing this need by dramatically improving their manufacturing processes.

Partners

Acknowledgements

Solar Media