New Product: In situ XRF tool for CIGS from Solar Metrology caters to high-volume production

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  Solar Metrology SMX-ISI

Product Briefing Outline: Solar Metrology, a provider of X-Ray Fluorescence (XRF) analysis tools, has expanded its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-ISI.

Problem: The properties of TFPV films are notoriously difficult to measure due to their special optical properties. This is compounded by the high-volume production requirements of thin-film substrates and the impact the wrong composition can have on decreasing efficiency and manufacturing yield.

Solution: Solar Metrology’s System SMX-ISI is an in situ x-ray fluorescence (XRF) metrology tool platform that provides composition and thickness measurements for thin-film solar PV metal film stacks on flexible roll-to-roll substrates, such as stainless steel, aluminum and polyimide, or rigid substrates such as float glass. SMX-ISI is incorporated into the process at a clean vacuum insertion point. The x-ray head is bolted to a specially designed port (see example below), allowing x-rays to pass in and out of your process vessel. The free-standing X-Ray Control Station (with available light pole alarm system) may be positioned either adjacent to or remotely from the process. A single SMX-ISI control station is capable of controlling multiple Ethernet-linked x-ray head modules. Static SMX-ISI configurations position the x-ray head at a stationary location along the web or glass panel line. Linear SMX-ISI configurations are designed to facilitate cross-web or panel gradient analysis, and may incorporate multiple vacuum/x-ray interface ports.

Applications: Typical measurement applications include Mo thickness and all CIGS combinations (including all CIG alloys and/or film combinations and final CIGS formulations).

Platform: SMX-ISI is fast, flexible and easily integrated into any vacuum deposition tool or vacuum process station or point of a vacuum process line. SMX-ISI utilizes x-ray fluorescence, an enabling technology for CIGS manufacture that delivers yield management and yield improvement by allowing in situ process control. The SMX-ISI tool platform does not affect your process since all SMX-ISI tool components reside outside of vacuum for optimum performance and serviceability.

Availability: Currently available.