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Product Briefing Outline: Xiris Automation has released the PVCI-1500 Machine Vision Platform targeted at crystalline silicon cell and wafer inspection. Optimized for inspection of solar cells as an incoming single-pass quality check, the PVCI-1500 combines specially designed optical components with fast analysis software, ensuring precise detection and classification of physical defects arising from shipping and handling.
Problem: In the final selection of cells to be assembled into modules, quality control checks are required to ensure that cells with cracks, pinholes, edge defects, geometry variances, global and localized color variances and other visible surface anomalies are captured and binned.
Solution: Using a combination of visible and non-visible illumination sources and a unique single optical path, dual camera system, the PVCI-1500 can be configured for many common inspection requirements including crack detection, edge defect detection, surface inspection, print inspection, color binning and color homogeneity. Modular System design allows for performing standardized inspections in a single pass, reducing process variation and the need for multiple inspection stations. High Resolution Area Scan cameras allow for consistent measurement of solar cells in any orientation.
Applications: Crystalline silicon cell and wafer inspection.
Platform: The PVCI-1500 is initially offered in two variants; a low cost configuration with high powered back illumination, front illumination and a high resolution monochrome camera targeting incoming cell inspection for module manufacturers and a feature rich version which adds multi-angle front illumination and an accurate color camera to support cell classification. GUI interface allows the operator to tune the inspection parameters and tune defect sensitivity to match process requirements.
Availability: October 2009 onwards.
