Evans Analytical Group (EAG), with its wide array of analysis techniques and world-class scientists, can provide fast, state-of-the-art measurements that can give you the insight you need to improve your products and manufacturing processes. EAG serves photovoltaic companies worldwide by providing advanced materials characterization services to help improve knowledge of both materials and processes.
EAG serves companies working in the following areas and with the following technologies: raw materials suppliers; suppliers, processors and users of single crystal silicon, multicrystalline silicon and polysilicon; thin film users and producers, including amorphous silicon, CdTe, CIGS and III-V structures.
EAG helps companies understand their materials and processes by providing a wide array of characterization methods to provide information about: crystallinity, material purity, contamination levels, film thickness, film composition, film roughness, dopant levels, microstructure, diffusion etc..
Analytical measurements available from EAG, that have particular relevance to the PV industry include: SIMS, GDMS, TEM, SEM, EDS, FIB, XRD, XPS, XRF, ICP-MS, ICP-OES, TOF-SIMS, FTIR, Raman and TGA.
Our unique and wide ranging expertise is utilized globally by companies developing solar technologies, from academic groups and government-funded laboratories to early stage start-ups and multinational companies.
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The main area for improvement of III-V thin film PV is increased conversion efficiency for concentrator PV systems, and manufacturing scale up.
EAG has a long and extensive history in the characterization of complex epitaxial films of compound semiconductor materials for lighting and high speed electronics applications. That knowledge and experience transfers directly to the analysis of multi-junction III-V solar cell film structures.
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The main areas for improvement of CdTe thin film PV products are the cell and module efficiencies. Materials characterization using EAG surface analysis methods can be used to support R&D of efficiency improvements and also to monitor starting materials and production processes.
Read more >>The main area for potential improvement of CIGS thin film PV is performance reliability and uniformity as manufacturing is scaled up. Materials characterization using surface analytical methods provided by EAG are used to support R&D for efficiency improvements and also production ramps.
Read more >>Silicon wafer solar cells have been the mainstay of the PV industry. EAG has a range of analytical capabilities that can help silicon wafer solar cell manufacturers meet their key goals of increasing efficiency and reducing costs.
Read more >>Amorphous Si (α-Si), microcrystalline Si (µc-Si), nanocrystalline Si (nc-Si), amorphous SiGe (α-SiGe), and microcrystalline SiC (µc-SiC), are all thin film materials that can be used in PV layer stacks ranging from simple α-Si thin film PV structures to more complex tandem and multi-junction thin film PV structures.
Read more >>EAG offers two methods for evaluating PV Si feedstock in support of R&D, manufacturing, or for 3rd party verification of material: Glow Discharge Mass Spectrometry (GDMS) and Secondary Ion Mass Spectrometry (SIMS).
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