Solar module price erosion to cause industry fall-out, says Lux Research - 02 October 2008
U.S. House recesses, fails to pass tax bill, leaving solar, R&D credits in doubt - 29 September 2008
REC sold out of wafers for 2010 with $450 million order from Neo Solar Power - 30 September 2008
Sharp starts volume production at new thin-film plant - 01 October 2008
Solar investment tax credit extension will benefit U.S. utilities, SEPA believes - 05 October 2008
Emerging from stealth, Part III: Solyndra launches impressively, but questions remain - 10 October 2008
Canadian Solar inks 60-megawatt supply deal - 10 October 2008
Satcon to Deliver Prototype Next Generation Energy Storage Module to the US Navy - 10 October 2008
Up on the rooftop: Brightening prospects for solar technology - 10 October 2008
Sandia to manage DOE-funded solar projects - 10 October 2008
Defect identification and prevention are vital to the ultimate performance of any display and are particularly crucial at key manufacturing stages in order to keep production costs low. The NanoScan technology employs highly accurate and sensitive detection of problem-causing particles and pattern defects during FPD manufacture, providing submicron particle inspection for NexTechFAS AOI platforms. Through the use of NanoScan enabled equipment, such as the NexTStar(TM) and the FPDStar(TM), manufacturers can identify and map particle and pattern defects in the active matrix display as well as defects in the intricate circuits surrounding the active matrix. This can all be accomplished on a single platform and at resolutions as small as 300 nanometers, a level of accuracy unmatched within the display industry.
The NanoScan will be utilized primarily within the FPD industry and will be focused on the emerging OLED technology of both glass and flexible substrates. The technology will also be used for TFT/LCD displays, touch screen substrates and solar panels. The NanoScan works by utilizing innovative illumination techniques in conjunction with high precision optics in order to capture submicron particles. Then, NexTechFAS proprietary software algorithms process the captured images, delivering defect information in a variety of formats ready for online or offline evaluation.
Read the full story >>
This story in its entirety is available at the above link. Clicking on this link will direct you to the original story on another site.
