Aurora Control Technologies is launching at the 26th European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) in Hamburg, Germany for the first time a new in-line emitter dopant measurement system, dubbed ‘Decima CI.’ The system is claimed to be the industry’s first in-line, non-contact emitter dopant measurement system featuring whole-wafer mapping at full production throughput for 100% of manufactured cells.
The Decima CI is said to be the first in a family of products to be launched by Aurora that provide for continuous cost-effective measurement of the critical-to-quality wafer parameters in today’s high-volume photovoltaic cell manufacturing processes.
“With the industry’s high-throughput, continuous production methods, tight real-time measurement and control of emitter fabrication variability is necessary to profitably meet market demand for PV cells that combine low cost and optimal power output,” commented Gordon Deans, CEO of Aurora. “In the development of the Decima CI, we worked closely with leading cell manufacturers to ensure that it focuses squarely on the issues affecting profitability, thereby providing rapid payback when used in production.”
The Decima CI measures the diffused dopant within a polycrystalline silicon wafer, similar to sheet resistance.
The modular head is positioned above the production line and connects to Aurora's PMC, a central controller for line-wide measurement integration and operations.