With the FPI solar series, dr. schwab IT has developed metrology systems covering all aspects of the production process for thin-film panel manufacturing. The new system meets volume production speed requirements with full surface measurement for quality assurance as well as continuous monitoring of all process parameters helping to increase productivity and yield of production lines.
Due to the chain-like structures of PV modules, total efficiency is usually less than the average of individual panels. High productivity and efficiency require process stability from uncoated substrates to final panels. A central challenge for the production of large thin-film solar panels is to achieve the highest possible uniformity of the coating layer and the optimum surface haze for maximum light trapping and energy conversion.
Dr. schwab IT's FPI solar series offers inline inspection for the manufacturing of large scale a-Si or µ-Si and CIS/CIGS-based thin-film panels. Equipped with in-house developed spectrometers, the system provides fast full surface thickness evaluation of multiple layers at nanoscale resolution and simultaneously analyzes the spectral haze of the TCO layer. Both tasks are performed for the complete surface in one pass within the cycle time of production. The modular design of the FPI solar suits virtually any sample size, e.g., a panel width of 2.2m. Database supported software modules allow permanent monitoring of all process stations. Analyzing the effects of parameter changes in real-time enables automated closed loop functionality to control and optimize the complete manufacturing chain.
a-Si or µ-Si and CIS/CIGS based thin film panels.
Due to the modularity of the FPI solar series, it can handle almost any sample size and can easily be integrated into modern production lines. Depending on the application purpose, the system can also be equipped with InGaAs cameras or with CCD line scan cameras.