BT Imaging introduced the LIS-P2 platform, the solar photovoltaic industry’s first multi-function inspection and analysis system designed for significantly speeding up failure analysis and sampling in production, at the EU PVSEC conference and exhibition in Valencia, Spain.
Available in two configurations, the LIS-P2 platform has capabilities in a single tool that can replace the current operator-intensive practice of using four or more tools in the cell production line lab.
The LIS-P2w can inspect samples at all process stages, including as-cut wafers, while the LIS-P2x inspects samples post-diffusion and onwards to finished cells. The imaging-based information provided by the LIS-P2 platform has the potential to enable faster and better decision making in solar cell production, resulting in cost savings and increased yield.
“The LIS-P2 platform is a direct response to our customers’ need to increase solar cell production yield,” explained Ian Maxwell, chief executive officer of BT Imaging. “We look forward to working with our customers to help them rapidly and accurately identify and diagnose production line problems.”
The LIS-P2 is on display at BT Imaging’s booth on Level 2, Hall 3, Stand 8.