BT Imaging has launched its iLS-X1 inspection system, specifically designed for the cost-effective inline monitoring of solar photovoltaic electrical process quality, at the 25th EU PVSEC exhibition. The iLS-X1 inspects processed wafers and cells at a rate of 3,600 wafers per hour, enabling cell manufacturers to quickly understand and fix the electrical wafer issues that are impacted by a given process step.
The iLS-X1 is designed for integration over-the-process-belt or with OEM systems, and includes automated defect classification software.
“Electrical process quality is an important metric for our customers, especially as the industry moves towards higher efficiency cells,” said Ian Maxwell, CEO of BT Imaging. “We believe that the iLS-X1 will help solar photovoltaic manufacturers focus on the process issues that matter to them and increase final cell performance.”
Existing inline solar PV inspection tools primarily monitor only the physical attributes of solar wafers and cells like thickness, cracks, color, and pattern using optical techniques, while electrical defects such as dislocations and impurities in the wafer, and defects introduced by incorrect cell processing go unnoticed.
The iLS-X1 offers automatic defect classification by extracting defect signatures from the high-resolution PL images and reporting the different process defect types seen in cell processes. By inspecting and detecting defects generated by a given process, the defects can then be correlated with final cell performance.
The iLS-X1, which will start shipping to beta customers in the fourth quarter of 2010, will be on display at BT Imaging’s EU PVSEC booth on Level 2, Hall 3, Stand 8.