Isra Solar Vision has introduced a unique defect inspection system for compound spots on cell edges, which can cause short-circuits when the cells enter the flashing process. Inspection at this stage is seen to ensure level ‘A’ quality for at least the first 400 cells per batch. The new ‘SOLARSCAN-Bevel’ system is designed to prevent wafer/cell scrap and provides the possibility to react immediately with protective or maintenance actions.
In order to optimize production efficiency, to increase machine uptimes and to reduce manufacturing costs, one major goal is to detect defects such as contamination and unclean coating in the manufacturing process as early and as fast as possible. Precise bevel inspection leads the way to highest-efficiency solar cell manufacturing. Detecting compound spots and contamination on surfaces right after the printing process, before cell firing, is essential in order to produce ‘A-level’ solar cells.
SOLARSCAN-Bevel inspects the c-Si cells after the printing process but before the firing process. This enables manufacturers to clear compound spots on cell edges that could lead to short-circuits in all subsequent cells in the process flow. The systeme also provides a reliable inspection alarm for the maintenance staff and signals that aged meshes have to be exchanged. Cell edges are the most critical areas for compound spots because the pressure exerted on the mesh is extremely high. The system is claimed to provide the optimum solution for this problem, enabling early detection of edge defects such as contamination or spots. Being applied in every production line right after printing and before the firing process the system enables PV manufacturers to optimize the process and to avoid non-reparable defects.
Cell inspection preventing compound spots on cell edges post metallization step but pre firing step.
Isra Solar Vision claims that the SOLARSCAN-Bevel inspection system provides with a return on investment on a single system of 4 months or below. This is due to fast installation / commissioning and recognition of all relevant defects during normal production throughput levels. SOLARSCAN-Bevel system is claimed to guarantee improved cell qualities, less reclamations and increased yield with top-level cells.
September 2011 onwards.