Magma Design Automation and Orion Metrology have partnered to integrate Magma’s just-launched YieldManager Solar yield enhancement package with Orion’s inline inspection technology for photovoltaic manufacturing applications. Through this partnership, Magma says it plans to expand the capabilities of its yield analysis platform, which enables solar panel manufacturers to increase their defect identification rate and improve process control.
The integration of Magma’s yield enhancement software system customized for solar fabs with Orion’s inline inspection technology will allow PV cell manufacturers to monitor random and parametric inline defects and instantaneously feed this information back to manufacturing to minimize the impact and severity of defects, thus improving yield and product efficiencies.
Orion has also adopted YieldManager as the central data analysis solution for its inline process and parametric measurement applications.
“The key to improving product efficiencies and manufacturing productivity is to identify how carrier lifetimes are being affected by process layer over a large area–from the surface to the bulk of the material–on 100% of the production throughput,” said Joe Foster, CEO of Orion. “Our inline approach ensures a more accurate characterization of process variation.
“If monitored and corrected quickly, even small changes can yield dramatic improvements in product yield and efficiency, significantly increasing the value of the solar panels. Magma’s YieldManager Solar enables the inline and metrology data to be reported, managed, and understood in real time.”
“YieldManager Solar was developed to reduce solar fab inefficiencies and help accelerate the growth of the alternative energy market,” said Ankush Oberai (pictured at left), VP of Magma’s fab analysis business unit. “Partnering with Orion Metrology will enable us to offer an enhanced product portfolio for PV solar cell manufacturers.”
Oberai discussed Magma’s entry into the PV manufacturing space in a PV Tech blog published in August 2008. To check out the blog, click here.