Product Briefing Outline: Helmut Fischer GmbH Institut für Elektronik und Messtechnik has introduced the ‘FISCHERSCOPE’ X-RAY Conti 5000 series, which uses energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line process control. They are specially designed for continuous non-destructive analysis of alloys and measurement of thin layers and layer systems, best suited to measure CIGS, CIS, CdTe in thickness and composition.
Problem: TFPV films are difficult to measure due to their special optical properties. The right thickness and composition of active layers is required to ensure performance efficiency and durability of the thin film modules and enable only the correct thicknesses are deposited to control material and production costs.
Solution: The measurement of the photo active layers is possible on various substrates like glass panels, thin metal or plastic foils. For each application the x-ray source and the semiconductor detector can be customized for best results. For simple integration into production lines the Conti 5000 comes with a standardized mounting flange. Various modular build versions are available to measure in vacuum or ambient air. With an additional cooling flange very hot substrats with surface temperatures of up to 500°C can be measured. Calibration is said to be quick and easy with a master-piece directly in the production process. Due to a large aperture, state of the art semiconductor detectors and a digital pulse processor the Conti 5000 is claimed to produce excellent repeatability combined with an good longtime stability. The necessity for re-calibration is dramatically reduced, saving time and effort.
Applications: CIGS, CIS, CdTe thin film thickness and composition.
Platform: The entire operation, the analysis of the measurement signals and the display of all information is carried out by an evaluation PC with the easy to use WinFTM® software. Due to a versatile communication interface all Conti 5000 are easily integrated into industrial process control systems.
Availability: Currently available.
