The 12th Edition was published in May 2011. Highlights from this edition include Conergy’s in-depth study of MES in PV facilities; University of Konstanz heralds the return of UMG-Si; RWTH Aachen University details the gettering options available for selective emitters; TU Delft presents an overview of breakage issues for silicon wafers and cells; and the University of Toledo outlines the benefits of RTSE in polarized light metroscopy.
