Product Briefing Outline: Veeco Instruments recentlylaunched the Dektak 150 Surface Profiler, which is designed to monitorthin films of advanced PVs as well as critical surface roughness, keyfor optimal absorption of photons. The standard Dektak 150 utilizes anewly designed 4 x 4-inch X-Y stage with manual theta. It can beconfigured with a 4-inch Y auto stage that enables 3D imaging, orequipped with a 6-inch X-Y auto stage that, in addition to 3D mapping,provides automation and programmability of over 200 sample sites. Withthe scan-stitching package, the system can perform even longer scansfor stress measurements on larger wafers. Other stage features includewafer alignment pins for ease of use, three-point suspension forstress, lateral calibration for 99.9% accuracy, and a larger scan blockfor improved baseline stability, according to the company.
