Astronergy’s ASTRO N n-type TOPCon PV modules have passed rigorous UVID tests, with a degradation rate of only 0.7% under UV60 exposure, reflecting the outstanding reliability of the company’s products to guarantee long-term stable power generation.
Based on RETC’s 2024 PV Module Index Report, UVID remains one of the industry’s significant challenges to module reliability.
UVID refers to the performance degradation of PV modules under ultraviolet irradiation. If modules are exposed to sunlight for long periods, the UV rays in the sunlight will not only shorten the lifespan of encapsulation materials, but also affect the structure of passivation layers on the cell surface and destroy the Si-H bonds, thus affecting the effect of interfacial passivation and leading to a decline in power generation.
By optimizing the structure of the cell passivation film layer, Astronergy adopts industry-leading thin film deposition technology to effectively improve the densification of the film layer. The adoption of this technology results in a thicker and higher-precision Aluminum Oxide (ALO) film layer, making the silicon wafers free of winding plating. Meanwhile, combined with LIF (laser induced firing) technology, the UV resistance of the film layer is effectively enhanced.
Through continuous research and innovation, Astronergy has developed a cell UV monitoring system, identifying the impact of new cell types and processes on UVID performance, thus providing a more effective means of monitoring product quality and guaranteeing higher reliability.
