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Multicrystalline PERC solar cells: Is light-induced degradation challenging the efficiency gain of rear passivation?

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By Tabea Luka, Christian Hagendorf & Marko Turek, Fraunhofer Center for Silicon Photovoltaics CSP, Halle (Saale), Germany

The passivated emitter and rear cell (PERC) process has been successfully transferred to mass production, with the market share of multicrystalline (mc) silicon being around 50%. This new technology can, however, lead to severe reliability issues despite the higher initial solar cell efficiencies. In particular, light-induced degradation (LID) of mc-PERC solar cells has been reported to cause efficiency losses of up to 10%rel. This highlights the importance of understanding different types of LID and of testing the stability of solar cells under actual operating conditions.

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This issue of Photovoltaics International focuses on the steady adoption of PERC as the technology of choice for providing a quick boost to cell performances. Our chief analyst, Finlay Colville, reports that PERC is a key driver for internal technology roadmaps of all silicon cell providers and is indirectly influencing the development of other technologies in competing n-type and thin-film segments. However, PERC is not without its drawbacks, and one of these is its increased susceptibility to light-induced degradation. Other highlights include ISC Konstanz on the future of back-contact technology and ECN on the development of a new technique for minimising recombination losses in silicon solar cells.

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