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10 May 2012, 12:59
BT Imaging has launched the next-generation iLS-W2 for on-the-fly photoluminescence (PL) inspection of wafer quality; the all-new iS-G1 for inline cast mono grain inspection; a new automation unit, the iQ, that houses the iLS-W2 and/or iS-G1 so that existing production lines can be upgraded; and, the QS-W2, a fully integrated inspection tool that can automatically sort wafers. With this suite of tools, wafer makers and fully integrated PV manufacturers can inspect every wafer in production and understand its electrical performance before they make it into a cell, thereby commanding premium pricing for wafers and cells.
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26 April 2012, 10:12
Designed for diamond wire cut and slurry cut monocrystalline, quasimono and multicrystalline wafers, SCHMID’s ‘Metrology Sorter’ with ‘Analyzer Software’ option takes final inspection into the realm of critical process inspection. SCHMID’s analyzer software compiles the measurement data of the finished wafers in a three dimensional brick, which establishes the basic information for the specific intervention in the upstream production steps.
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24 April 2012, 09:33
DuPont Microcircuit Materials (MCM) has introduced ‘DuPont Solamet PV416’ photovoltaic metallization paste used to raise the efficiency of thin film photovoltaic cells. The front-side silver paste material has the capability to be processed at temperatures below 140°C, and is designed to provide improved contact resistance, conductivity, adhesion and fine line resolution when printed on Transparent Conductive Oxides (TCOs). The new paste has been claimed to have boosted CIGS thin-film manufacturer, Midsummer AB’s cell efficiencies by as much as 0.5%.
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23 March 2012, 15:22
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14 March 2012, 12:47
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13 March 2012, 16:58