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Metrology at the ingot level: Addressing the growing importance of bulk material quality

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By Bernhard Mitchell, Daniel Chung, Jürgen Weber & Thorsten Trupke University of New South Wales (UNSW), Sydney; BT Imaging Pty Ltd, Sydney, Australia

With the PV industry continually pushing for ever-higher silicon solar cell efficiencies, the requirements on the electronic quality of the bulk material are becoming more stringent. Advanced characterization of silicon
ingots after cutting into bricks allows early quality control and immediate feedback in crystal growth, thereby facilitating shorter R&D cycles, higher yield, lower cost and higher product quality in mass manufacturing.

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This issue of Photovoltaics International focuses on cell technology trends, manufacturing capacity, cell efficiency, mitigating light-induced degredation, new printing techniques, progress in thin-film technology and studies of studies of multicrystalline PV modules. Finlay Colville also provides a full market analysis of cell technology trends impacting module supply in 2017.

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