By Vivek Gade; Narendra Shiradkar
A working group of the international PV Quality Assurance Task Force has been undertaking research and testing initiatives aimed at improving the design and long-term reliability of module junction boxes and bypass diodes. Vivek Gade and Narendra Shiradkar, who are active leaders of this work, report on efforts to shine a light on a hitherto poorly understood aspect of module reliability.
