Craic Technologies’ 20/20 PV microspectrometer measures thickness of thin-film optical

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Product Briefing Outline: Craic Technologies has launched the 20/20 PV Microspectrometer, which is designed to measure UV-visible NIR-range transmission, absorbance, reflectance, and emission and fluorescence spectra of sample areas smaller than a micron in width. The thickness of thin films and colour spaces can also be determined. The 20/20 PV system is claimed to be the most powerful instrument from Craic Technologies. 

Problem: Engineers need to test the quality of the cell from a number of different aspects, which can be challenging due to the lack of range of some microspectrometers on the market.

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Solution: The 20/20 PV Microspectrometer can take spectra and images of microscopic samples from the deep ultraviolet to near infrared with one seamless operation. It can acquire microspectra and images in absorbance, reflectance, and fluorescence, and is available with both the DirecVu function to view samples by eye as well as with a high-resolution UV-visible NIR digital imaging system. While microspectra are being acquired, the sample may be viewed with high-resolution digital imaging in the deep UV, in colour or in the near infrared. Additional ease of use features include improvements to the instrument's ergonomics, software and automation.

Applications: The tool can measure UV-visible NIR-range transmission, absorbance, reflectance, and emission and fluorescence spectra of sample areas smaller than a micron in width with one seamless operation. Sampling areas can range from over 100 microns across to less than a micron.

Platform: Available with both the DirecVu to view samples by eye as well as a high-resolution UV-visible-NIR digital imaging system.

Availability: Currently available.

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