Aurora Solar Technologies' founder and COO Gordon Deans tells PV Tech how inline measurement and monitoring can protect yield, prevent process excursions and ultimately, ensure maximum profitability for PV manufacturers.

Tags: aurora solar technologies, aurora solar, pv celltech, solar cell, monocrystalline wafer, measurements, quality control, furnace wafer positions, visualize and characterize process performance, visualization and control for diffusion and annealing furnaces, emitter dopant measurement system, whole wafer mapping, pv modules

Comments