Product Briefing Outline: BrightView Systems has unveiled the InSight M Series, which it claims to be the world's first in-line process control and optimization tool developed specifically to address the challenges faced by thin-film solar cell manufacturers. The Wide Area Metrology (WAM) system provides continuous monitoring and whole-panel mapping of critical material and process parameters at full production throughput and for 100% of manufactured panels.
Problem: Solar cell performance depends on a complex interaction of photoelectrical effects, material properties, and layer interface characteristics. Optical and electrical parameters must be balanced to achieve optimal conversion efficiency, and maintained within narrow process windows.
Solution: By combining an in-line metrology technology and matching spatial data analysis solutions that are driven by in-depth knowledge of thin-film PV process and volume production, the InSight M Series is the integral solution for improving thin-film PV panel efficiency and long-term reliability. Easily integrated at key steps in any thin-film production line including single-junction and multijunction silicon, the system allows panel producers to implement process optimization solutions that enhance average panel efficiency, improve line productivity, and verify full compliance with the strictest durability and quality requirements. With its ‘True Cell’ technology, the InSight is able to measure and map critical layers on-the-fly within the actual product stack, providing continuous process fingerprinting that drives production improvement, excursion detection and line productivity.
Applications: All thin-film modules. Complete panel mapping of critical material and process parameters.
Platform: The system architecture allows for easy integration into the design of new production lines or insertion into existing ones, including Gen 5 and Gen 8.5 lines. The InSight M Series represents a systems approach to enhancing thin-film production. The BrightView tool is complemented by an intuitive operating interface and state-of-the-art software modules that allow easy implementation and customization of intelligent line monitoring recipes, spanning all production stages, from process integration, through pilot and multi-location volume manufacturing. The methodology provides customers with 24/7 visibility into their manufacturing process.
Availability: January 2009 onwards.
