Discover our upstream and downstream technical journals

Towards a test standard of light and elevated temperature-induced degradation

Understanding of LeTID remains incomplete, although its effects on PV power plant performance are recognised as being potentially significant. Friederike Kersten, Matthias Pander, Max Koentopp, Marko Turek, Werner Bergholz and Thomas Pernau of the LeTID Norm consortium outline progress towards developing a standardised test for the defect, a key step inw minimising its impact

SOLARWATT passes LeTID IEC test by VDE Renewables

Germany-based PV module manufacturer SOLARWATT has successfully met the IEC CD 61215-1: Ed.2.0 test for Light and elevated Temperature Induced Degradation (LeTID) for its Vision 60M series PV panels, undertaken by testing and certification house, VDE Renewables.

The complexity of LID, LeTID and HID

Photovoltaic (PV) modules are a general product of the PV industry. PV modules need to be used outdoors. The outdoor reliability of these products is an important quality indicator and light induced degradation (LID) is one of the most intensively discussed reliability indicators.

Hanwha Q CELLS’ touts success of its anti-LeTID module performance in Fraunhofer CSP tests

Recently billed by solar industry experts as another degradation crisis that could be worse than the impact on PV module performance than PID (potential Induced Degradation), ‘Silicon Module Super League’ (SMSL) member, Hanwha Q CELLS has highlighted that both its mono and multicrystalline products have performed exceptionally well in LeTID (Light and elevated Temperature Induced Degradation) tests undertaken by Fraunhofer CSP.

Is LeTID degradation in PERC cells another degradation crisis even worse than PID?

When we visit conferences and industrial players, we are very often surprised at how many responsible scientists for PERC production have never heard about the severe degradation effects that PERC devices can show – in particular when talking about LeTID (Light and elevated Temperature Induced Degradation) alias Carrier Induced Degradation (CID).